Two test strategies are used to test virtually all IC logic—automatic test pattern generation (ATPG) with test pattern compression, and logic built-in self-test (BIST). For many years, there was a ...
PALO ALTO, Calif.–Agilent Technologies Inc. today rolled out a desktop version of its flash-memory and logic tester line. The Versatest Model V4000 is a complete, single platform that is geared for ...
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