Chinese Researchers Identify Key Cause of Semiconductor Defects, Paving Way for Advanced GaN Technology
To study these microscopic defects, Professors Yang Xuelin and Shen Bo of Peking University used advanced scanning transmission electron microscopy (STEM) combined with deep-sectioning techniques.
Mass layoffs of federal workers could hurt families and local economies — but may not dent the overall economy
Elon Musk, wielding a chainsaw, is overseeing a rapid shrinking of the nation’s largest employer: the federal government.